- ✔ Integrates electronic Protection System
- ✔ Ensures ultra-high resolution
- ✔ Incorporates one-dimensional array detector
- ✔ Inbuilt circulating cooling water device
- ✔ Equipped with a printer
| Scanning Range |
-110° to 161° |
| Scanning Speed |
0.0012° – 120°/min |
| Minimum Stepping Angle |
0.0001° |
| 2θ Angle Repeatability Accuracy |
0.0001° |
| Angle Positioning Speed |
1500°/min (2θ) |
| Structure of Angle Measuring Instrument |
Vertical angle measuring instrument with θs-θd structure (224-bit absolute incremental grating) |
| Scanning Radius |
Standard 225 mm (continuously adjustable from 150 mm to 325 mm) |
| Drive Mode |
θs-θd linkage; θs or θd single action |
| Output Stability |
≤ 0.005% (with power supply voltage fluctuation of 10%) |
| Linearity of Full Spectrum Diffraction Angle |
≤ ± 0.01° (International Standards) |
| Spectral Resolution |
687 ± 5 [eV] (rms) (MYTHEN) or 125 [eV] (SDD) |
| Maximum Linear Count Rate |
1 x 10⁹ CPS (no noise, MYTHEN) or 1 x 10⁵ CPS (noise ≤ 0.2 CPS, SDD) |
| X-Ray Leakage |
≤ 0.12 µSv/h (at maximum X-ray tube power) |
| Comprehensive Stability |
≤ 0.3% (40 kV, 40 mA, continuous operation for 8 hours) |
| X-Ray Tube Voltage |
10–60 kV, 1 kV/step |
| X-Ray Tube Current |
2–60 mA, 1 mA/step |
| Power Supply |
2.4 kW / 3 kW |
| Dimensions (L × W × H) |
1300 × 1000 × 1800 (mm) |
XRD Diffractometer FM-XRD-A100 is used to measure the structure, composition, and properties of materials by analyzing the way they scatter or diffract a beam of radiation and is mainly used in scientific research, the pharmaceutical industry, and nanotechnology.
