Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.
Specifications
Magnification | 1x to 2,500,000x | ||||||
Resolution | 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM) | ||||||
Voltage | 20 V to 30 kV | ||||||
Electron Gun | Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective | ||||||
Vacuum System |
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Vacuum Pump |
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Working Stage | 5 Axes Auto Stage, X:120 mm, Y:115 mm, Z:50 mm, T: -10° to + 90°, R: 360° | ||||||
Camera | Vertical Optical Navigation CCD, Horizontal Monitoring CCD | ||||||
Detector | Secondary Electron Detector (ETD), High Angle Electron Detector In lens | ||||||
Software | SEM Operation Software | ||||||
Display | Multi-Channel Display | ||||||
Navigation | Gesture navigation | ||||||
Image enhancement features | Auto Brightness Contrast, Auto Focus, Auto Astigmatism | ||||||
Image format support | TIFF, JPG, BMP, PNG | ||||||
Computer specification | Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system | ||||||
Installation Room |
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Power Supply | AC 220 V (±10 %), 50 Hz,2 kVA |
Features
Applications
Accessories Optional
Accessories no | Name | Quantity |
1 | BSE Back Scattering | 1 |
2 | EDS Energy Dispersive | 1 |
3 | EBSD, Electron Beam Backscattered | 1 |
4 | EBSD Bruker Quantax e-Flash | 1 |
5 | EDS+EBSD, Electron | 1 |
6 | STEM | 1 |
7 | EBIC, Electron Beam | 1 |
9 | Knob Control Panel &Trackball | 1 |
10 | Sample Exchange | 1 |
11 | Beam Gate & Electron | 1 |
12 | Low Vacuum Detector (LV Module, Work With BSE) | 1 |
13 | Double Anode (Tetrode) | 1 |
14 | Tungsten Filament | 6 pcs in one box |
15 | Large Size Image Stitching Software | 1 |
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