XRD Diffractometer FM-XRD-A100 Catalog

Description :

XRD Diffractometer FM-XRD-A100 has a scanning range of -110° to 161° and a scanning speed between 0.0012° and 120°/min for precise angle measurement. It supports transmission mode for enhanced flexibility in data collection. This unit offers high resolution and a strong diffraction signal for reliable results. Our XRD Diffractometer comes with a lead door interlocking device for enhanced safety.

Features:

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Specifications:

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Scanning Range	-110° to 161°
Scanning Speed	0.0012° – 120°/min
Minimum Stepping Angle	0.0001°
2θ Angle Repeatability Accuracy	0.0001°
Angle Positioning Speed	1500°/min (2θ)
Structure of Angle Measuring Instrument	Vertical angle measuring instrument with θs-θd structure (224-bit absolute incremental grating)
Scanning Radius	Standard 225 mm (continuously adjustable from 150 mm to 325 mm)
Drive Mode	θs-θd linkage; θs or θd single action
Output Stability	≤ 0.005% (with power supply voltage fluctuation of 10%)
Linearity of Full Spectrum Diffraction Angle	≤ ± 0.01° (International Standards)
Spectral Resolution	687 ± 5 [eV] (rms) (MYTHEN) or 125 [eV] (SDD)
Maximum Linear Count Rate	1 x 10⁹ CPS (no noise, MYTHEN) or 1 x 10⁵ CPS (noise ≤ 0.2 CPS, SDD)
X-Ray Leakage	≤ 0.12 µSv/h (at maximum X-ray tube power)
Comprehensive Stability	≤ 0.3% (40 kV, 40 mA, continuous operation for 8 hours)
X-Ray Tube Voltage	10–60 kV, 1 kV/step
X-Ray Tube Current	2–60 mA, 1 mA/step
Power Supply	2.4 kW / 3 kW
Dimensions (L × W × H)	1300 × 1000 × 1800 (mm)

Applications: XRD Diffractometer FM-XRD-A100 is used to measure the structure, composition, and properties of materials by analyzing the way they scatter or diffract a beam of radiation and is mainly used in scientific research, the pharmaceutical industry, and nanotechnology.