Description :
Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.
Features:
- Field emission scanning electron microscope with high resolution
-
Advanced Tube Design to enhance beam stability and focus
-
High-pressure tunnel technology examines samples sensitive to vacuum
-
Low aberration design minimizes optical distortion
-
Magnetic Field Lens (MFL) improves imaging capabilities
-
Optical navigation aids in the precise positioning and navigation of samples
-
Automated function for automated focusing, stage movement
-
Human-Computer Interaction efficiently controls and monitor the instrument
Specifications:
| Magnification |
1x to 2,500,000x |
| Resolution |
1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM) |
| Voltage |
20 V to 30 kV |
| Electron Gun |
Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective |
| Vacuum System |
| Type | Fully Auto Control Oil Free Vacuum | | Sample Room pressure | < 5×10-4 Pa | | Electron Gun pressure | < 9 ×10-8 Pa |
|
| Vacuum Pump |
| Mechanical pump flow rate | > 6 m3/h | | Turbo molecular pump flow rate | > 240 L/s | | Ion pump flow rate | >25 L/s |
|
| Working Stage |
5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360° |
| Camera |
Vertical Optical Navigation CCD, Horizontal Monitoring CCD |
| Detector |
Secondary Electron Detector (ETD), High Angle Electron Detector In lens |
| Software |
SEM Operation Software |
| Display |
Multi-Channel Display |
| Navigation |
Gesture navigation |
| Image enhancement features |
Auto Brightness Contrast, Auto Focus, Auto Astigmatism |
| Image format support |
TIFF, JPG, BMP, PNG |
| Computer specification |
Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system |
| Installation Room |
| Dimension | L > 3000 mm, W > 4000 mm, H > 2300 mm | | Temperature | 20 to 25 ℃ | | Humidity | < 50% |
|
| Power Supply |
AC 220 V (±10 %), 50 Hz，2 kVA |
Applications:
Scanning Electron Microscope is widely used across various scientific and industrial fields, including materials science, biology, geology, and nanotechnology.
|
Accessories Optional:
| Accessories no |
Name |
Quantity |
| 1 |
BSE Back Scattering |
1 |
| 2 |
EDS Energy Dispersive |
1 |
| 3 |
EBSD, Electron Beam Backscattered |
1 |
| 4 |
EBSD Bruker Quantax e-Flash |
1 |
| 5 |
EDS+EBSD, Electron |
1 |
| 6 |
STEM |
1 |
| 7 |
EBIC, Electron Beam |
1 |
| 9 |
Knob Control Panel &Trackball |
1 |
| 10 |
Sample Exchange |
1 |
| 11 |
Beam Gate & Electron |
1 |
| 12 |
Low Vacuum Detector (LV Module, Work With BSE) |
1 |
| 13 |
Double Anode (Tetrode) |
1 |
| 14 |
Tungsten Filament |
6 pcs in one box |
| 15 |
Large Size Image Stitching Software |
1 |
|
